Would you benefit from a professional materials characterisation consultancy service?  Cranfield University can help.  Our microscopy services offer a state of the art suite of equipment combined with an experienced technical team of specialists.

Join us for our open day to visit the facility and attend some short talks about our capabilities. The open day is scheduled for Wednesday 16th October 2024.

Click here to register your interest in attending our open day! 

We hope to see you there!

Our facility is fully-equipped with cutting-edge instrumentation to carry out the following:

• scanning electron microscopy (SEM),
• energy dispersive X-ray spectroscopy (EDS).
• electron backscatter diffraction (EBSD),
• focused ion beam (FIB),
• time-of-flight secondary ion mass spectrometry (ToF-SIMS),
• X-ray diffraction (XRD),
• atomic-force microscopy (AFM),
• 3D digital microscopy,
• and optical microscopy

To find out more please get in touch by emailing us at microscopyservices@cranfield.ac.uk or visit our website: www.cranfield.ac.uk/microscopy-services